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X-Ray Diffraction  (XRD)

X-ray diffraction is a non-destructive analytical technique useful in the identification of crystalline materials.  In this test, an x-ray beam interacts with a specimen and the scattered x-rays experience both constructive and destructive interference.  The intensities of the diffracted x-rays when detected at various angles depend on the crystal structure of the specimen and as a result, crystalline materials exhibit their own unique fingerprint.  

Clients most often request XRD analysis to determine the identities and crystal structures of their samples.


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